Linear scan: is used to describe the scan format in which the active beam aperture is electronically moved across the length of a linear arrar probe,either at normal incidence or a fixed angle. This format is alternately known as an "E-scan" in certain ASME and IIW document.
线性扫查：用于描述激活声束孔径，在声波垂直入射或以固定角度斜入射的情况下，以电子方式沿线性阵列探头的长度方向移动的扫查方式。这个扫查方式在某些ASME和IIW的文献中被称为“E-扫查”。
提升卡
置顶卡
沉默卡
喧嚣卡
变色卡
千斤顶
显身卡